Capacitated qualification management in semiconductor manufacturing

In semiconductor manufacturing, machines are usually qualified to process a limited number of recipes related to products. It is possible to qualify recipes on machines to better balance the workload on machines in a given toolset. However, all machines of a toolset do not have equal uptimes and may further suffer from scheduled and unscheduled downtimes. This may heavily impact an efficient recipe-to-machine qualification configuration. In this paper, we propose indicators for recipe-to-machine qualification management based on the overall toolset workload balance under capacity constraints. The models, deployed in industry, demonstrate that the toolset capacity must be considered while managing qualifications. Industrial experiments show how capacity consideration leads to an optimal qualification configuration and therefore capacity utilization.

[1]  R. Fletcher Practical Methods of Optimization , 1988 .

[2]  Marie-Laure Espinouse,et al.  Minimizing setup costs for parallel multi-purpose machines under load-balancing constraint , 2008, Eur. J. Oper. Res..

[3]  James P. Ignizio Cycle time reduction via machine-to-operation qualification , 2009 .

[4]  Reha Uzsoy,et al.  Heuristics for capacity planning problems with congestion , 2009, Comput. Oper. Res..

[5]  Stephen J. Wright,et al.  Numerical Optimization , 2018, Fundamental Statistical Inference.

[6]  Stephane Dauzere-Peres,et al.  Qualification management and its impact on capacity optimization , 2013, ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference.

[7]  José Humberto Ablanedo-Rosas,et al.  Makespan and workstation utilization minimization in a flowshop with operations flexibility , 2011 .

[8]  David G. Luenberger,et al.  Linear and nonlinear programming , 1984 .

[9]  C. Heavey,et al.  Impact of Recipe Restrictions on Photolithography Toolsets in an ASIC Fabrication Environment , 2013, IEEE Transactions on Semiconductor Manufacturing.

[10]  S. Nash,et al.  Linear and Nonlinear Optimization , 2008 .

[11]  Kenneth K. Boyer,et al.  Manufacturing flexibility at the plant level , 1996 .

[12]  Stéphane Dauzère-Pérès,et al.  Flexibility measures for qualification management in wafer fabs , 2011 .

[13]  W. Hoyer Variants of the reduced Newton method for nonlinear equality constrained optimization problems , 1986 .

[14]  S. Dauzere-Peres,et al.  Importance of Qualification Management for Wafer Fabs , 2007, 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.

[15]  A. Aubry,et al.  Robust Load-Balanced Configuration With Fixed Costs For The Parallel Multi-Purpose Machines Problem , 2006, 2006 International Conference on Service Systems and Service Management.

[16]  Jacques Pinaton,et al.  Optimized allocation of defect inspection capacity with a dynamic sampling strategy , 2015, Comput. Oper. Res..

[17]  Carl Johnzén,et al.  Modeling and optimizing flexible capacity allocation in semiconductor manufacturing , 2009 .

[18]  Stéphane Dauzère-Pérès,et al.  Qualification management with batch size constraint , 2013, 2013 Winter Simulations Conference (WSC).

[19]  Philip E. Gill,et al.  Practical optimization , 1981 .

[20]  Cheng-Hung Wu,et al.  Coordinated capacity planning in two-stage thin-film-transistor liquid-crystal-display (TFT-LCD) production networks , 2014 .