A Semi-empirical Approach for Heavy Ion SEU Cross Section Calculations
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F. Wrobel | G. Hubert | P. Iacconi | P. Iacconi | F. Wrobel | G. Hubert
[1] T. R. Weatherford,et al. The shape of heavy ion upset cross section curves (SRAMs) , 1993 .
[2] M. Xapsos. Applicability of LET to single events in microelectronic structures , 1992 .
[3] F. Wrobel,et al. Criterion for SEU occurrence in SRAM deduced from circuit and device Simulations in case of neutron-induced SER , 2005, IEEE Transactions on Nuclear Science.
[4] Guillaume Hubert,et al. Detailed analysis of secondary ions' effect for the calculation of neutron-induced SER in SRAMs , 2001 .
[5] Hiroyuki Shindo,et al. Correlation between proton and heavy-ion SEUs in commercial memory devices , 2003, 2003 IEEE Radiation Effects Data Workshop.
[6] D. McMorrow,et al. The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM , 2005, IEEE Transactions on Nuclear Science.
[8] G. L. Hash,et al. Effects of particle energy on proton-induced single-event latchup , 2005, IEEE Transactions on Nuclear Science.
[9] S. Crain,et al. SEE sensitivity trends in non-hardened high density SRAMs with sub-micron feature sizes , 2003, 2003 IEEE Radiation Effects Data Workshop.
[10] F. Sexton,et al. Further development of the Heavy Ion Cross section for single event UPset: model (HICUP) , 1995 .