Controllable LFSR for BIST

This paper presents the preliminary results for a novel mixed-mode scheme to generate test patterns for random pattern resistant faults. It is based on a programmable method in contrast to the hardware implementation used so far. It not only guarantees the full test coverage in the combinational stuck-at faults, but also can be extended to the sequential or delay path testing. The result shows that the full test coverage was possible with the smaller size of control vectors, up to a 70% reduction in size from the original scan test vectors.

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