Degradation assessment of 1.2-kV SiC MOSFETs and comparative study with 1.2-kV Si IGBTs under power cycling
暂无分享,去创建一个
Yiqiang Chen | Hong-Zhong Huang | P. Lai | Chang Liu | Yuan Chen | Xinbing Xu | Zhiyuan He | Yunliang Rao
暂无分享,去创建一个
Yiqiang Chen | Hong-Zhong Huang | P. Lai | Chang Liu | Yuan Chen | Xinbing Xu | Zhiyuan He | Yunliang Rao