论文信息 - Development of Biaxial Tensile Test System for in-situ Scanning Electron Microscope and Electron Backscatter Diffraction Analysis - 字舞流文

Development of Biaxial Tensile Test System for in-situ Scanning Electron Microscope and Electron Backscatter Diffraction Analysis

H. Yoshida | H. Takuda | Seiichi Suzuki | A. Uenishi | T. Hama | Y. Nakazawa | Kubo Masahiro