Compact CA-Based Single Byte Error Correcting Codec
暂无分享,去创建一个
[1] M. Y. Hsiao,et al. A class of optimal minimum odd-weight-column SEC-DED codes , 1970 .
[2] Gian Carlo Cardarilli,et al. Data integrity evaluations of Reed Solomon codes for storage systems [solid state mass memories] , 2004 .
[3] Dhiraj K. Pradhan,et al. Fault Tolerant Single Error Correction Encoders , 2011, J. Electron. Test..
[4] B. Arun Kumar,et al. Efficient Majority Logic Fault Detection with Difference-Set Codes for Memory Applications , 2013 .
[5] Pedro Reviriego,et al. An Efficient Single and Double-Adjacent Error Correcting Parallel Decoder for the (24,12) Extended Golay Code , 2016, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[6] Adrian Evans,et al. A Class of SEC-DED-DAEC Codes Derived From Orthogonal Latin Square Codes , 2015, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[7] Sanghyeon Baeg,et al. Multiple cell upsets tolerant content-addressable memory , 2011, 2011 International Reliability Physics Symposium.
[8] Nur A. Touba,et al. Exploiting Unused Spare Columns to Improve Memory ECC , 2009, 2009 27th IEEE VLSI Test Symposium.
[9] R.C. Baumann,et al. Radiation-induced soft errors in advanced semiconductor technologies , 2005, IEEE Transactions on Device and Materials Reliability.
[10] Marco Ottavi,et al. A Method to Construct Low Delay Single Error Correction Codes for Protecting Data Bits Only , 2013, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[11] G.C. Cardarilli,et al. Fault tolerant solid state mass memory for space applications , 2005, IEEE Transactions on Aerospace and Electronic Systems.
[12] Yongsurk Lee,et al. Protection of On-chip Memory Systems against Multiple Cell Upsets Using Double-adjacent Error Correction Codes , 2015, IEICE Trans. Electron..
[13] 藤原 英二,et al. Code design for dependable systems : theory and practical applications , 2006 .
[14] Kevin Barraclough,et al. I and i , 2001, BMJ : British Medical Journal.
[15] Shalini Ghosh,et al. Dynamic Low-Density Parity Check Codes for Fault-tolerant Nanoscale Memory , 2007 .
[16] Santanu Chattopadhyay,et al. Additive cellular automata : theory and applications , 1997 .
[17] Salvatore Pontarelli,et al. Concurrent Error Detection in Reed–Solomon Encoders and Decoders , 2007, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[18] Jagannath Samanta,et al. CA-Based Area Optimized Three Bytes Error Detecting Codes , 2015, J. Cell. Autom..
[19] Pedro Reviriego,et al. Efficient error detection in Double Error Correction BCH codes for memory applications , 2012, Microelectron. Reliab..
[20] P. Reviriego,et al. Enhanced Detection of Double and Triple Adjacent Errors in Hamming Codes Through Selective Bit Placement , 2012, IEEE Transactions on Device and Materials Reliability.
[21] B. Rai,et al. LOW DELAY SINGLE SYMBOL ERROR CORRECTION CODES BASED ON REED SOLOMON CODES , 2016 .
[22] Dipanwita Roy Chowdhury,et al. New Architectural Design of CA-Based Codec , 2010, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[23] Xiaoxuan She,et al. SEU Tolerant Memory Using Error Correction Code , 2012, IEEE Transactions on Nuclear Science.
[24] Shu Lin,et al. Error Control Coding , 2004 .
[25] Kazutoshi Kobayashi,et al. A Radiation-Hard Redundant Flip-Flop to Suppress Multiple Cell Upset by Utilizing the Parasitic Bipolar Effect , 2013, IEICE Trans. Electron..
[26] P.P. Ankolekar,et al. Multibit Error-Correction Methods for Latency-Constrained Flash Memory Systems , 2008, IEEE Transactions on Device and Materials Reliability.
[27] W. Marsden. I and J , 2012 .
[28] Sanghyeon Baeg,et al. Memory Reliability Analysis for Multiple Block Effect of Soft Errors , 2013, IEEE Transactions on Nuclear Science.