HYSIM: Hybrid Fault Simulation for Synchronous
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[1] Douglas B. Armstrong,et al. A Deductive Method for Simulating Faults in Logic Circuits , 1972, IEEE Transactions on Computers.
[2] David Bryan,et al. Combinational profiles of sequential benchmark circuits , 1989, IEEE International Symposium on Circuits and Systems,.
[3] Melvin A. Breuer,et al. Digital systems testing and testable design , 1990 .
[4] Kewal K. Saluja,et al. On fault deletion problem in concurrent fault simulation for synchronous sequential circuits , 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.
[5] F. Somenzi,et al. MOZART: a concurrent multilevel simulator , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[6] Silvano Gai,et al. The fault dropping problem in concurrent event-driven simulation , 1991, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[7] Ernst G. Ulrich,et al. Concurrent simulation of nearly identical digital networks , 1973, Computer.
[8] Janak H. Patel,et al. PROOFS: a super fast fault simulator for sequential circuits , 1990, Proceedings of the European Design Automation Conference, 1990., EDAC..
[9] Sudhakar M. Reddy,et al. On efficient concurrent fault simulation for synchronous sequential circuits , 1992, [1992] Proceedings 29th ACM/IEEE Design Automation Conference.
[10] Paolo Prinetto,et al. Diagnosis oriented test pattern generation , 1990, Proceedings of the European Design Automation Conference, 1990., EDAC..
[11] Sundaram Seshu,et al. On an Improved Diagnosis Program , 1965, IEEE Trans. Electron. Comput..
[12] Zhicheng Wang,et al. LECSIM: a levelized event driven compiled logic simulation , 1991, DAC '90.
[13] Kewal K. Saluja,et al. An Efficient Algorithm for Sequential Circuit Test Generation , 1993, IEEE Trans. Computers.
[14] Nikolaus Gouders,et al. PARIS: a parallel pattern fault simulator for synchronous sequential circuits , 1991, 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers.
[15] Dong Sam Ha,et al. HOPE: an efficient parallel fault simulator for synchronous sequential circuits , 1992, DAC '92.
[16] S. Davidson,et al. Sequential Circuit Test Generator (STG) benchmark results , 1989, IEEE International Symposium on Circuits and Systems,.
[17] Randal E. Bryant,et al. Graph-Based Algorithms for Boolean Function Manipulation , 1986, IEEE Transactions on Computers.