Method for the determination of the thermophysical properties of evaporated thin films

Abstract A method for detailed investigation of the thermophysical properties of thin films after removal from their substrates is proposed. The thermal conductivity coefficient λ, the coefficient of total emissivity e and the resistivity ϱ of Al and Ag polycrystalline evaporated films 500–1000 A thick have been determined in the temperature range 300–900 K.