Laser Induced Damage in Optical Materials: 1980.

Abstract : The Symposium was divided into sessions concerning Materials and Measurements, Mirrors and Surfaces, Thin Films, and finally Fundamental Mechanisms. The emphasis of the papers presented at the Symposium was directed toward new frontiers and new developments. Particular emphasis was given to materials for high power systems. The wavelength range of prime interest was from 10.6 microns to the uv region. Highlights included surface characterization, thin film-substrate boundaries, and advances in fundamental laser-matter threshold interactions and mechanisms. The scaling of damage thresholds with pulse duration, focal area, and wavelength was discussed in detail.

[1]  Davidson Black.  On measurement and identification , 1928 .

[2]  M. J. Soileau,et al.  Pulse-Width and Focal-Volume Dependence of Laser-Induced Breakdown , 1981 .

[3]  C. Hogge,et al.  Characteristics of phase-aberrated nondiffraction-limited laser beams. , 1974, Applied optics.

[4]  H. E. Bennett,et al.  Laser Induced Damage in Optical Materials: 1979. , 1980 .

[5]  M. Bass,et al.  Evaluation of metal mirrors for high-power applications by multi-threshold damage analysis , 1977, IEEE Journal of Quantum Electronics.

[6]  A. Guenther,et al.  Damage in Laser Glass , 1969 .

[7]  R. W. Stobie,et al.  Automatic ellipsometer with high sensitivity and special advantages for infrared spectroscopy of adsorbed species. , 1975, Applied optics.

[8]  T. A. Tombrello,et al.  A technique for measuring hydrogen concentration versus depth in solid samples , 1973 .

[9]  T. Hall.  Point defects in solids , 1978, Nature.

[10]  J. Bennett,et al.  Stylus profiling instrument for measuring statistical properties of smooth optical surfaces. , 1981, Applied optics.

[11]  Simplified formulae for solitons in media with slowly varying inhomogeneity , 1980 .

[12]  David Milam,et al.  Determination of laser damage thresholds by comparison with an absolute laser damage standard , 1981 .

[13]  N. Bloembergen.  Role of cracks, pores, and absorbing inclusions on laser induced damage threshold at surfaces of transparent dielectrics. , 1973, Applied optics.

[14]  G. J. Rosasco,et al.  Internal field resonance structure: Implications for optical absorption and scattering by microscopic particles , 1978 .

[15]  R Loudon,et al.  Quantum Theory of the Solid State , 1977 .

[16]  P. Ciddor,et al.  Apparent shape of broad band, multilayer reflecting surfaces. , 1967, Applied optics.

[17]  M. Kabler.  Hole Centers in Halide Lattices , 1972 .

[18]  R. Cotellessa.  Physics of III-V compounds , 1965 .

[19]  Harold E. Bennett,et al.  Standards For Optical Surface Quality Using Total Integrated Scattering , 1979, Other Conferences.

[20]  C. T. Moynihan,et al.  Infrared transmitting glasses based on hafnium fluoride , 1980 .

[21]  R P Netterfield,et al.  Coating Fabry-Perot interferometer plates with broadband multilayer dielectric mirrors. , 1980, Applied optics.

[22]  Narkis Tzoar,et al.  Propagation of nonlinear optical pulses in inhomogeneous media , 1978 .

[23]  E. B. Graper.  Distribution and Apparent Source Geometry of Electron-Beam-Heated Evaporation Sources , 1973 .

[24]  G. Bryant,et al.  Deformation of intense laser beams tightly focused inside NaCl: A comparison of the multiphoton-polaron and avalanche models of optical breakdown , 1981 .

[25]  Jb Franck,et al.  On Self-Focusing and Spot-Size Dependence of Laser-Induced Breakdown , 1981 .

[26]  A. A. Studna,et al.  High precision scanning ellipsometer. , 1975, Applied optics.

[27]  P. A. Temple.  Improved Dark-Field-Like Surface Inspection Technique Using Total Internal Reflection , 1980, Other Conferences.

[28]  H. E. Bennett,et al.  Simple expressions for predicting the effect of volume and interface absorption and of scattering in high-reflectance or antireflectance multilayer coatings , 1980 .

[29]  D. Joy,et al.  Ion‐beam‐deposited polycrystalline diamondlike films , 1976 .

[30]  P. A. Temple,et al.  The relative importance of interface and volume absorption by water in evaporated films , 1980 .

[31]  Jean M. Bennett,et al.  Precise Method for Measuring the Absolute Phase Change on Reflection , 1964 .

[32]  Marcel Poulain,et al.  Lanthanum fluorozirconate glasses , 1979 .

[33]  E Garmire,et al.  Ion beam micromachining of integrated optics components. , 1973, Applied optics.

[34]  J. E. Carroll,et al.  Gallium Arsenide and Related Compounds , 1977 .

[35]  C. Giuliano,et al.  Laser-Induced Damage in Optical Materials , 1973 .

[36]  S. Aisenberg,et al.  Physics of Ion Plating and Ion Beam Deposition , 1973 .

[37]  L. J. Cox.  Ellipsometry and Polarized Light , 1978 .

[38]  A. Ghatak,et al.  V Self Focusing of Laser Beams in Plasmas and Semiconductors , 1976 .

[39]  M. J. Howes.  Nondestructive Evaluation of Semiconductor Materials and Devices , 1980 .

[40]  A. Scott,et al.  The soliton: A new concept in applied science , 1973 .

[41]  J. Ebert,et al.  Pyroelectric measurement of absorption in oxide layers and correlation to damage threshold , 1980 .

[42]  O. Svelto,et al.  I Self-Focusing, Self-Trapping, and Self-Phase Modulation of Laser Beams , 1974 .

[43]  S. Aisenberg,et al.  Ion‐Beam Deposition of Thin Films of Diamondlike Carbon , 1971 .

[44]  T. Bridges,et al.  Dichroic Calcite Polarizers for the Infrared , 1965 .

[45]  Akira Hasegawa,et al.  Transmission of stationary nonlinear optical pulses in dispersive dielectric fibers. I. Anomalous dispersion , 1973 .

[46]  J. Connolly,et al.  Specifications Of Raytran Material , 1979, Other Conferences.