A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit
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[1] A. Dell'Acqua,et al. Geant4 - A simulation toolkit , 2003 .
[2] Luca Sterpone,et al. On the prediction of radiation-induced SETs in flash-based FPGAs , 2016, Microelectron. Reliab..
[3] Dmitry V. Boychenko,et al. IC SEE Comparative Studies at UCL and JINR Heavy Ion Accelerators , 2016, 2016 IEEE Radiation Effects Data Workshop (REDW).
[4] He Wei,et al. Research on the influence of charge sharing for SEE locations based on 65nm CMOS technology , 2015, 2015 IEEE International Conference on Communication Problem-Solving (ICCP).
[5] Alan Wood,et al. The impact of new technology on soft error rates , 2011, 2011 International Reliability Physics Symposium.
[6] Lai Jinmei,et al. Effect of charge sharing on the single event transient response of CMOS logic gates , 2011 .
[7] Luca Sterpone,et al. Radiation-induced SET on Flash-based FPGAs: Analysis and Filtering methods , 2017 .
[8] L. W. Massengill,et al. Single Event Transients in Digital CMOS—A Review , 2013, IEEE Transactions on Nuclear Science.