New multilinear solid state detector for digital slot scan radiography

A novel solid state detector has been developed for digital radiography. It is based on an assembly of CCD chips operated in TDI mode. The X-ray detection is achieved by a CsI scintillator layer which features a needle structure. It combines an excellent resolution with a high absorption efficiency. The detector is able to operate in 2 modes: a standard resolution mode and a high resolution mode. In the standard mode, the detector features a 440 mm long sensitive area and a 162 micrometer pixel size. The total number of pixels along detector direction is 2720. Along the scan direction, the detector features a 10.8 mm wide sensitive area. A TDI process is performed in the chip itself over 67 X- ray sensitive elements. A 440 mm X 440 mm sized image can be acquired in typically 1.2 second. The high resolution mode allows producing images with an 81 micrometer pixel size. The detection dynamic range is 10,000:1. The main performance characteristics of the detector are presented, such as DQE, MTF, dynamic range.