An integrated circuit semiconductor device having built-in self-repair circuit for embedded memory and a method for repairing the memory

PURPOSE: An IC(integrated circuit) semiconductor device with a magnetic restoring circuit for a built-in memory and a method of restoring memory are provided to precisely test defect of the built-in memory having multiple redundancies. CONSTITUTION: A built-in memory(30) has a plurality of row redundancies and a plurality of column redundancies. A self-test circuit detects defect of the memory. A self-restoring circuit stores information of the defect detected from the self-test circuit and decides a restoring method of the defect responding to the information and then generates addresses restored by the restoring method to the built-in memory. In the self-restoring circuit, a self-test controller(21) controls an entire operation of the self-restoring circuit. The first restoring portion stores defect row addresses generated in the memory and the number of defects generated in the corresponding row.