论文信息 - Nanoscale probing of dielectric breakdown at SiO2/3C-SiC interfaces - 字舞流文

Nanoscale probing of dielectric breakdown at SiO2/3C-SiC interfaces

G. Ferro | M. Weng | F. Giannazzo | F. Roccaforte | V. Raineri | P. Fiorenza | J. Eriksson | J. Lorenzzi | N. Jegenyes