Electrostatic Discharge Protection in the Nano-Technology - Will We be able to Provide ESD Protection in the Future?

Electrostatic discharge (ESD) phenomenon will play a critical role in the introduction, manufacturing and implementation of present day semiconductor devices and future nano-structures as presented by Voldman (2002). In the future, the ability to produce nanostructures may be limited by the ESD sensitivity of these electronic and mechanical elements. The ESD technology roadmap has been shown, highlighting a decreasing ESD robustness with technology scaling. ESD technology scaling issues in advanced CMOS, RF CMOS, silicon germanium, to gallium arsenide will be reviewed. ESD issues from wafer-level charging, on-chip protection, to off-chip protection have been discussed. In addition trends in RF MEMs, FINFETs, magnetic recording, photo-masks to carbon nano-tubes (CNT) have been discussed.

[1]  K. Bock ESD issues in compound semiconductor high frequency devices and circuits , 1997, Proceedings Electrical Overstress/Electrostatic Discharge Symposium.

[2]  A. Marshall,et al.  ESD evaluation of the emerging MuGFET technology , 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

[3]  October I Physical Review Letters , 2022 .

[4]  S. Voldman,et al.  Lightning rods for nanoelectronics. , 2002, Scientific American.

[5]  Steven H. Voldman,et al.  ESD failure mechanisms of inductive and magnetoresistive recording heads , 1995 .

[6]  G. Meneghesso,et al.  Transmission line pulse (TLP) testing of radio frequency (RF) micro-machined micro-electromechanical systems (MEMS) switches , 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.

[7]  Steven H. Voldman ESD: Circuits and Devices , 2005 .

[8]  P. Avouris,et al.  Current saturation and electrical breakdown in multiwalled carbon nanotubes. , 2001, Physical review letters.

[9]  P. Avouris,et al.  Engineering Carbon Nanotubes and Nanotube Circuits Using Electrical Breakdown , 2001, Science.

[10]  J. Montoya,et al.  A study of the mechanisms for ESD damage to reticles , 2001, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476).

[11]  S. Voldman ESD: Physics and Devices , 2004 .

[12]  S. Voldman,et al.  Electrostatic discharge (ESD) protection of giant magneto-resistive (GMR) recording heads with a silicon germanium technology , 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

[13]  K. Shrier,et al.  Cell phone GaAs power amplifiers: ESD, TLP, and PVS devices , 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

[14]  J. Bokor,et al.  FinFET-a quasi-planar double-gate MOSFET , 2001, 2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177).

[15]  S. Voldman ESD : RF Technology and Circuits , 2006 .