Single-Event Transient Testing of Low Dropout PNP Series Linear Voltage Regulators
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P. C. Adell | Dakai Chen | G. R. Allen | P. Adell | Dakai Chen | G. Allen | P. Musil | P. Musil
[1] Florent Miller,et al. Comparison of single event transients generated at four pulsed-laser test facilities - NRL, IMS, EADS, JPL , 2011 .
[2] V. Pouget,et al. Total Dose and Single Event Transients in Linear Voltage Regulators , 2007, IEEE Transactions on Nuclear Science.
[3] Dean Lewis,et al. Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC , 2004, IEEE Transactions on Instrumentation and Measurement.
[4] V. Pouget,et al. Investigation of Single-Event Transients in Linear Voltage Regulators , 2008, IEEE Transactions on Nuclear Science.
[5] J. Laird,et al. Scanning picosecond tunable laser system for simulating MeV heavy ion-induced charge collection events as a function of temperature. , 2008, The Review of scientific instruments.
[6] L. D. Edmonds,et al. A model for single-event transients in comparators , 2000 .
[7] K. A. LaBel,et al. Development of a test methodology for single-event transients (SETs) in linear devices , 2001 .
[8] P. Perdu,et al. Influence of Laser Pulse Duration in Single Event Upset Testing , 2005, IEEE Transactions on Nuclear Science.
[9] C. Poivey,et al. Pulsed-laser testing methodology for single event transients in linear devices , 2004, IEEE Transactions on Nuclear Science.
[10] R. Koga,et al. Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators , 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).
[11] R.D. Schrimpf,et al. Single Event-Induced Instability in Linear Voltage Regulators , 2006, IEEE Transactions on Nuclear Science.
[12] L. W. Massengill,et al. Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser , 2002 .
[13] peixiong zhao,et al. Critical charge for single-event transients (SETs) in bipolar linear circuits , 2001 .
[14] S. Buchner,et al. Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies , 1994 .
[15] T. Scott,et al. Application of a pulsed laser for evaluation and optimization of SEU-hard designs , 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).
[16] T. Scott,et al. Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS] , 1999 .
[17] Robert Ecoffet,et al. Observation of heavy ion induced transients in linear circuits , 1994, Workshop Record. 1994 IEEE Radiation Effects Data Workshop.
[18] V. Pouget,et al. Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL , 2011, IEEE Transactions on Nuclear Science.
[19] J.S. Laird,et al. Single-Event Transients in Voltage Regulators , 2006, IEEE Transactions on Nuclear Science.
[20] D. Lewis,et al. Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC , 2003, Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412).
[21] Stephen LaLumondiere,et al. Observation of single event upsets in analog microcircuits , 1993 .
[22] Stephen LaLumondiere,et al. Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions , 1997 .
[23] P. C. Adell,et al. Analysis of single-event transients in analog circuits , 2000 .