An Observability Branch Coverage Metric Based on Dynamic Factored Use-Define Chains
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Tao Lv | Yang Zhao | Ling-yi Liu | Hua-wei Li | Xiao-wei Li
[1] Simeon C. Ntafos,et al. On Required Element Testing , 1984, IEEE Transactions on Software Engineering.
[2] Michael Wolfe,et al. High performance compilers for parallel computing , 1995 .
[3] Kurt Keutzer,et al. Coverage Metrics for Functional Validation of Hardware Designs , 2001, IEEE Des. Test Comput..
[4] John P. Hayes,et al. Design verification via simulation and automatic test pattern generation , 1995, ICCAD.
[5] Chien-Nan Jimmy Liu,et al. An observability measure to enhance statement coverage metric for proper evaluation of verification completeness , 2005, Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005..
[6] Kurt Keutzer,et al. An observability-based code coverage metric for functional simulation , 1996, ICCAD 1996.
[7] Michael Kantrowitz,et al. I'm done simulating; now what? Verification coverage analysis and correctness checking of the DEC chip 21164 Alpha microprocessor , 1996, DAC '96.
[8] M. Kantrowitz,et al. I'm done simulating; now what? Verification coverage analysis and correctness checking of the DECchip 21164 Alpha microprocessor , 1996, 33rd Design Automation Conference Proceedings, 1996.
[9] Kurt Keutzer,et al. An observability-based code coverage metric for functional simulation , 1996, Proceedings of International Conference on Computer Aided Design.
[10] Xiaowei Li,et al. An efficient observability evaluation algorithm based on Factored Use-Def chains , 2003, 2003 Test Symposium.
[11] Kurt Keutzer,et al. OCCOM: efficient computation of observability-based code coverage metrics for functional verification , 1998, Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175).
[12] H. Al-Asaad,et al. Design verification via simulation and automatic test pattern generation , 1995, Proceedings of IEEE International Conference on Computer Aided Design (ICCAD).
[13] Giovanni Squillero,et al. RT-Level ITC'99 Benchmarks and First ATPG Results , 2000, IEEE Des. Test Comput..
[14] Xiaowei Li,et al. Observability Statement Coverage Based on Dynamic Factored Use-Definition Chains for Functional Verification , 2006, J. Electron. Test..