Auger electron spectroscopy

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[2]  H. Bishop Electron scattering in thick targets , 1967 .

[3]  M. Prutton,et al.  Techniques for the correction of topographical effects in scanning Auger electron microscopy , 1983 .

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[5]  J. Rivière,et al.  Estimates of the Efficiencies of Production and Detection of Electron-Excited Auger Emission , 1969 .

[6]  J. Väyrynen Differences in L2,3MM Auger electron spectra of atomic and metallic manganese , 1981 .

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[8]  D. Goodman Single crystals as model catalysts , 1982 .

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[11]  N. MacDonald Auger Electron Spectroscopy in Scanning Electron Microscopy: Potential Measurements , 1970 .

[12]  J. Matthew Extra-atomic relaxation in Auger electron emission , 1979 .

[13]  A. R. Koymen,et al.  Measurement of positron annihilation induced Auger electron emission from Fe, Cu, Pd, and Au , 1992 .

[14]  Shen,et al.  Spin-dependent electron attenuation by transmission through thin ferromagnetic films. , 1991, Physical review letters.

[15]  C. Powell Contrasting Valence-Band Auger-Electron Spectra for Silver and Aluminum , 1973 .

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[17]  T. Madey,et al.  Coadsorption-Induced Azimuthal Ordering in Molecular Adsorbate Layers:H2O and NH3on Oxygen-Precovered Ni(111) , 1981 .

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[19]  K. Sevier Low energy electron spectrometry , 1972 .

[20]  A. Jablonski Dependence of the backscattering factor in aes on the primary electron incidence angle , 1983 .

[21]  H. H. Madden Chemical information from Auger electron spectroscopy , 1981 .

[22]  E. Taglauer,et al.  Sputtering and radiation-enhanced segregation in amorphous CuTi alloys , 1991 .

[23]  H. Tokutaka,et al.  A quantitative auger electron spectroscopy method (applied to a thin film monolayer overgrowth) , 1983 .

[24]  R. L. Watson,et al.  M1V,VNN Auger spectra of tellurium and some of its compounds , 1978 .

[25]  R. E. Weber,et al.  Use of LEED Apparatus for the Detection and Identification of Surface Contaminants , 1967 .

[26]  S. Ichimura,et al.  Backscattering correction for quantitative auger analysis : II. Verifications of the backscattering factors through quantification by AES , 1982 .

[27]  Homer D. Hagstrum,et al.  Photoelectron and Auger Spectroscopy , 1975 .

[28]  H. Saricimen,et al.  Initial stages of atmospheric corrosion of steel in the Arabian Gulf , 1991 .

[29]  P. Hall,et al.  Matrix effects in quantitative auger analysis of dilute alloys , 1979 .

[30]  D. Urch,et al.  Auger electron spectroscopy , 1985 .

[31]  J. Simpson,et al.  Improved Electrical Differentiation of Retarding Potential Measurements , 1958 .

[32]  R. Musket,et al.  Proton‐ and Electron‐Excited Auger Electron Spectra of Molybdenum Surfaces , 1972 .

[33]  D. Briggs,et al.  Practical surface analysis: By auger and x-ray photoelectron spectroscopy , 1983 .

[34]  W. Lotz Electron-impact ionization cross-sections for atoms up to Z=108 , 1970 .

[35]  H. Tokutaka,et al.  The electron mean free path (applicable to quantitative electron spectroscopy) , 1985 .

[36]  P. W. Palmberg,et al.  HIGH SENSITIVITY AUGER ELECTRON SPECTROMETER , 1969 .

[37]  Gerhard Ertl,et al.  Low Energy Electrons and Surface Chemistry , 1974 .

[38]  M. Seah Channel electron multipliers: quantitative intensity measurement—efficiency, gain, linearity and bias effects , 1990 .

[39]  E. Burhop Le rendement de fluorescence , 1955 .

[40]  P. W. Palmberg,et al.  OPTIMIZATION OF AUGER ELECTRON SPECTROSCOPY IN LEED SYSTEMS , 1968 .

[41]  J. Jenkin,et al.  Is there a universal mean-free-path curve for electron inelastic scattering in solids? , 1981 .

[42]  R. Shimizu,et al.  Backscattering correction for quantitative Auger analysis: I. Monte Carlo calculations of backscattering factors for standard materials , 1981 .

[43]  W. A. Dench,et al.  Characterisation of computer differentiation of spectra in AES and its relation to differentiation by the modulation technique , 1983 .

[44]  J. Yates,et al.  Kinetics of the hydrogenation of CO over a single crystal nickel catalyst , 1980 .

[45]  L. A. Harris Analysis of Materials by Electron‐Excited Auger Electrons , 1968 .

[46]  C. Powell The quest for universal curves to describe the surface sensitivity of electron spectroscopies , 1988 .

[47]  C. Hovland Scanning ESCA: A new dimension for electron spectroscopy , 1977 .

[48]  Ryuichi Shimizu,et al.  Quantitative Analysis by Auger Electron Spectroscopy , 1983 .

[49]  A. Jablonski Estimation of backscattering factor for low atomic number elements and their alloys , 1978 .

[50]  K. Siegbahn ESCA : atomic, molecular and solid state structure studied by means of electron spectroscopy , 1967 .

[51]  M. Seah Quantification and measurement by Auger electron spectroscopy and X-ray photoelectron spectroscopy , 1986 .

[52]  G. Wehner,et al.  Escape length of Auger electrons , 1973 .

[53]  C. Linsmeier,et al.  Ion scattering and Auger electron spectroscopy analysis of alumina-supported rhodium model catalysts , 1992 .

[54]  J. Rivière,et al.  Auger spectroscopy of silicon , 1969 .

[55]  R. W. Fink,et al.  X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition Probabilities , 1972 .

[56]  A. Jablonski The backscattering factor in Auger electron spectroscopy , 1979 .

[57]  A. R. Koymen,et al.  Apparatus for positron annihilation‐induced Auger electron spectroscopy , 1989 .

[58]  A. Czanderna,et al.  Ion Scattering Spectroscopy , 1991 .

[59]  Chattarji Theory of Auger transitions , 1976 .

[60]  G. Sawatzky QUASI-ATOMIC AUGER-SPECTRA IN NARROW-BAND METALS , 1977 .