Diagnostic Yield Characterization Expert (DYCE) - A Diagnostic Knowledge Based System Shell for Automated Data Analysis
暂无分享,去创建一个
[1] Edward H. Shortliffe,et al. Rule Based Expert Systems: The Mycin Experiments of the Stanford Heuristic Programming Project (The Addison-Wesley series in artificial intelligence) , 1984 .
[2] G. Scher,et al. In-line statistical process control and feedback for VLSI integrated circuit manufacturing , 1989, Proceedings. Seventh IEEE/CHMT International Electronic Manufacturing Technology Symposium,.
[3] William F. Punch. Large interactions of compiled and causal reasoning in diagnosis , 1992, IEEE Expert.
[4] S. Saxena. Fault isolation during semiconductor manufacturing using automated discovery from wafer tracking databases , 1993, Proceedings of 9th IEEE Conference on Artificial Intelligence for Applications.
[5] Jay M. Tenenbaum,et al. PIES: An Engineer's Do-It-Yourself Knowledge System for Interpretation of Parametric Test Data , 1986, AI Mag..