AN EXACT ANALYSIS FOR EFFICIENT COMPUTATION OF RANDOM-PATTERN TESTABILITY IN COMBINATIONAL CIRCUITS

ExperiowaIal ......... ibal .... I<sloblUty ID • IypkaI dn:tlil 10 -' __ likely .... to ........... biUIy don .... _biUly. n., _ I .... pradkal ............. it 10 .......... 1 to .... oIop aD ....... Ie ooodeI for o ....... bIUty .... puta_. 0IIe ..... IIIOdeI, ID I .... of ....... 1 ... Is pro ........ \be IInI "r! of tWs PIper tbas compIt_dRl our earlier wort. It Is DOW poIIible to ... l8 exact nlldG_ ,.HerD. testability for ucla be ill. clmdt. TIle .......... of ........ naly ... \be .. _Ie __ of • dmall '• .,. .. _ ......... 1. n.dIq. _Ie Is related to ............. _lor tree ... ....tIlled dn:tIil .,. ... ,,~ pro ...................... complexity of _10-' TIle ..... _ of ........ ."Ieads to IIIIIiIIpIe ootput cln:tIilS .... \be co"'l'lexlty of ........ 1110 ....... to be q ...... llc ............ of ...... .. the circulI.,.... By prior _II ... of \be .. xl .. 1 .. perple COYer, _eceI.ary d_plkatiGa ill computadoa 01 tatabtUty mIleS CD be ..........

[1]  Gary S. Ditlow,et al.  Random Pattern Testability , 1984, IEEE Transactions on Computers.

[2]  Sunil Jain,et al.  Statistical Fault Analysis , 1985, IEEE Design & Test of Computers.

[3]  Jacob Savir,et al.  Good Controllability and Observability Do Not Guarantee Good Testability , 1983, IEEE Transactions on Computers.

[4]  Hans-Joachim Wunderlich,et al.  PROTEST: A Tool for Probabilistic Testability Analysis , 1985, 22nd ACM/IEEE Design Automation Conference.

[5]  M. Ray Mercer,et al.  Testability Measures : What Do They Tell Us ? , 1982, ITC.