Oxygen-Related Defects Introduced by As+-Implantation through Cap Layers in Si Probed by Monoenergetic Positron Beams
暂无分享,去创建一个
A. Uedono | A. Nakano | H. Yamamoto | T. Ohdaira | R. Suzuki | S. Tanigawa | T. Mikado | M. Muramatsu | T. Ubukata | Hirotoshi Tanino