Design of error-resilient logic gates with reinforcement using implications
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[1] R. Iris Bahar,et al. Using Implications for Online Error Detection , 2008, 2008 IEEE International Test Conference.
[2] L. Garcia-Leyva,et al. Novel redundant logic design for noisy low voltage scenarios , 2013, 2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS).
[3] S. Yang,et al. Logic Synthesis and Optimization Benchmarks User Guide Version 3.0 , 1991 .
[4] Nur A. Touba,et al. Cost-effective approach for reducing soft error failure rate in logic circuits , 2003, International Test Conference, 2003. Proceedings. ITC 2003..
[5] R. Iris Bahar,et al. Enhancing online error detection through area-efficient multi-site implications , 2011, 29th VLSI Test Symposium.
[6] R. Iris Bahar,et al. A Simulation Framework for Analyzing Transient Effects Due to Thermal Noise in Sub-Threshold Circuits , 2015, ACM Great Lakes Symposium on VLSI.
[7] Branko Dokic. CMOS NAND and NOR Schmitt circuits , 1996 .
[8] Yiorgos Makris,et al. Soft Error Mitigation Through Selective Addition of Functionally Redundant Wires , 2008, IEEE Transactions on Reliability.
[9] Joseph L. Mundy,et al. Designing Nanoscale Logic Circuits Based on Markov Random Fields , 2007, J. Electron. Test..
[10] R. Iris Bahar,et al. A Cost Effective Approach for Online Error Detection Using Invariant Relationships , 2010, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[11] R. Iris Bahar,et al. A fast simulator for the analysis of sub-threshold thermal noise transients , 2016, 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC).
[12] Joseph L. Mundy,et al. A noise-immune sub-threshold circuit design based on selective use of Schmitt-trigger logic , 2012, GLSVLSI '12.
[13] G.E. Moore,et al. Cramming More Components Onto Integrated Circuits , 1998, Proceedings of the IEEE.
[14] M. Baze,et al. A digital CMOS design technique for SEU hardening , 2000 .
[15] Yu Cao,et al. Exploring sub-20nm FinFET design with Predictive Technology Models , 2012, DAC Design Automation Conference 2012.
[16] Kartik Mohanram,et al. Gate sizing to radiation harden combinational logic , 2006, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[17] D. Sylvester,et al. Soft Error Reduction in Combinational Logic Using Gate Resizing and Flipflop Selection , 2006, 2006 IEEE/ACM International Conference on Computer Aided Design.