论文信息 - Structural, morphological and 1/f noise properties of ITO/TiO2 thin films by e-beam evaporation system for optoelectronic device applications - 字舞流文

Structural, morphological and 1/f noise properties of ITO/TiO2 thin films by e-beam evaporation system for optoelectronic device applications

M. Krishnaiah | D. Sowmya | G. Sravya | V. Manjunath | P. Ananda | Kamsali Murali Mohan Achari | P. Sandhya

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