论文信息 - Understanding the factors affecting contact resistance in nanowire field effect transistors (NWFETs) to improve nanoscale contacts for future scaling - 字舞流文

Understanding the factors affecting contact resistance in nanowire field effect transistors (NWFETs) to improve nanoscale contacts for future scaling

H. Bender | N. Collaert | T. Ivanov | S. Ramesh | A. Sibaja-Hernandez | P. Favia | D. Lin | A. Milenin | S. El Kazzi | P. Lagrain | A. Alian | E. Camerotto | N. Pinna | K. De Meyer