论文信息 - A Next Generation Electron Microscopy Detector Aimed at Enabling New Scanning Diffraction Techniques and Online Data Reconstruction - 字舞流文

A Next Generation Electron Microscopy Detector Aimed at Enabling New Scanning Diffraction Techniques and Online Data Reconstruction

Brent R. Draney | A. Goldschmidt | T. Stezelberger | J. Joseph | P. Denes | A. Minor | P. Ercius | C. Ophus | K. Bustillo | J. Ciston | C. Tindall | David E. Skinner | I. Johnson | Ashwin Selvarajan | E. Fong | Jason R. Lee