论文信息 - The use of HI-ERDA/RBS and NRA/RBS to depth profile N in GaAs1−xNx thin films - 字舞流文

The use of HI-ERDA/RBS and NRA/RBS to depth profile N in GaAs1−xNx thin films

A. Muñoz-Martín | J. Plaza | B. J. García | D. Ghita | A. Climent-Font | M. Sanchez | R. W. Smith