A quantitative approach to study solid state phase coarsening in solder alloys using combined phase-field modeling and experimental observation

In the present work, a quantitative phase-field approach is introduced to study the phase-coarsening phenomena in solder alloys, Pb-Sn alloy here. The most important part of this work is to introduce a simple and versatile approach to quantify the experimental and simulation data, without putting into difficulties corresponding to the stochastic nature of phenomenon, in order to compute unknown physical data required to perform numerical simulation. For this purpose, at first, the evolution of microstructure vs. time is studied experimentally by the conventional optical microscopy. Then, unknown physical data, the interface mobility here, is computed by fitting the time evolution of the total interface perimeter of the simulation results to that of the experimental data. In fact, by this approach, the physical data is computed such that it will be applied to predict reality in the subsequent simulations, i.e., the presented method can be accounted as the calibration of the corresponding mathematical model and numerical method. The validity of the presented approach is supported by comparing simulation data to experimental ones.