A new test methodology for an exhaustive study of single-event-effects on power MOSFETs
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D. Bisello | Francesco Iannuzzo | Giovanni Busatto | Annunziata Sanseverino | Francesco Velardi | Giuseppe Currò | Jeffery Wyss | D. Pantano | P. Giubilato | S. Mattiazzo | L. Silvestrin | M. Tessaro
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