High performance raised source/drain InAs/In0.53Ga0.47As channel metal-oxide-semiconductor field-effect-transistors with reduced leakage using a vertical spacer
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M. Rodwell | A. Gossard | S. Stemmer | J. Law | B. Thibeault | Sanghoon Lee | Cheng-Ying Huang | D. Cohen-Elias | V. Chobpattanna | Stephan Krämer | W. Mitchell