Use of a modified mode‐matching method to analyze microstrip lines with thick strip conductors

This paper proposes an analytical method for microstrip lines with finite metallization thickness of the strip. The reliability of solution for such lines depends greatly on the treatment of the behavior of electromagnetic fields near the conductor edges of the strip. For example, when the conventional mode-matching method is used for the analysis, considerable modal functions are required to represent the field behavior near the conductor edge, making it difficult to obtain accurate results. An alternative method is presented for microstrip lines with finite metallization thickness of the strip. This method is based on the mode-matching method already presented by the authors where singularities of the electromagnetic field at the conductor edges are taken into account. The effectiveness of the present method is verified by investigating the convergence of solution and the edge effect in detail and also by comparing the results with others reported in the literature.