Statistical Analysis of Digital Circuits Subjected to EMI Induced Delays

Specifically, it is shown how to evaluate the pro­ bability the output will be HIGH. This can be used as a measure of system performance. For example, at a specific instant of time assume the output to a known input will be HIGH provided the system is behaving properly. When the system is interfered with, if the probability the output is HIGH at that instant equals 0.8, then the system will be in error in approximately 20% of the cases. By equating the binary output to the value 1 when it is HIGH and to the value 0 when it is LOW, the probability of the output being HIGH equals the statistical average (or expected value) of the out­ put. Hence, performance analysis is reduced to the pro­ blem of evaluating statistical averages.