RFIC and MMIC measurement techniques

A wide range of techniques has been briefly introduced for the measurement of MMICs. In general, the level of accuracy and repeatability obtainable is proportional to the initial investment costs of the measurement system. Compared with traditional invasive on-wafer measurement techniques, optical systems have so far demonstrated a lower dynamic range and inferior frequency resolution. In addition, optical techniques have complicated and lengthy calibration procedures. However, with its excellent spatial resolution and extremely wide band width capabilities, electro-optic probing may become commonplace in the not too distant future.