Characterization of short-period Sim Gen superlattices by high-resolution transmission electron microscopy and X-ray diffraction
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P. Ehrhart | H. Presting | E. Kasper | K. Leifer | H. Kibbel | W. Jäger | D. Stenkamp | W. Sybertz
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P. Ehrhart | H. Presting | E. Kasper | K. Leifer | H. Kibbel | W. Jäger | D. Stenkamp | W. Sybertz