论文信息 - Investigation of defect formation and electronic transport in microcrystalline silicon deposited by hot-wire CVD - 字舞流文

Investigation of defect formation and electronic transport in microcrystalline silicon deposited by hot-wire CVD

M. Nelhiebel | P. Schattschneider | J. Andreu | C. Voz | V. Schlosser | V. Plunger | J. Bertomeu | D. Peiró | A. Breymesser | M. Stöger | M. Ramadori