A scalar cost function for analyzing the quality of totally self-checking design methodologies

This paper proposes a scalar cost function for analyzing the quality of Totally Self-Checking combinational devices; in particular the presented evaluator allows one to take into account other significant aspects affecting a TSC implementation rather than area overhead. The cost function is based on a measure which dynamically defines the probability to achieve the TSC goal at cycle t with respect to fault occurrence and circuit stimulation. As some experimental results highlight, the smallest circuits aren't always the most desirable one.