论文信息 - Comparison between ground tests and flight data for two static 32 KB memories

Comparison between ground tests and flight data for two static 32 KB memories

The microelectronics and photonics testbed (MPTB) carrying twenty-four experiments on-board a scientific satellite has been in a high radiation orbit since November 1997. This paper presents single event Upset flight results on two commercial static RAMs includes in two of the MPTB experiments.

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