LSI logic testing — An overview

The development of large scale integration (LSI) testing is reviewed. The paper concentrates on the testing of logic components and presents in-depth discussions of the methods of fault modeling, test pattern generation, fault simulation, and design for testability. It is shown how these methods are used in the design of components and how they can be used in support of design automation. Finally, a brief account of test equipment and test data preparation is given.

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