论文信息 - Use of CF-252 to Determine Parameters for SEU Rate Calculation

Use of CF-252 to Determine Parameters for SEU Rate Calculation

A Cf-252 irradiation facility for single event testing of microcircuits has been developed. Testing techniques have been refined to include the capability of determining LET thresholds as well as event cross-sections. The capabilities and limitations of Cf-252 in testing to provide parameters for calculation of SEU rate in the heavy ion environment of space are discussed.

J. C. Pickel | J. T. Blandford | J. Pickel

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