论文信息 - Image processing of electron micrographs of deformed filaments

Image processing of electron micrographs of deformed filaments

Electron micrographs of filaments are frequently unsuitable for image processing because they are not perfectly straight. Even minor departures from straightness result in appreciable deterioration of the Fourier transform and analysis of periodicities and subsequent image processing becomes difficult. A procedure is described for recovering the projection of a straight filament from that of an imperfectly straight filament.

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