Parallel, multi-DUT testing in an open architecture test system

Parallel testing provides an increase in throughput without a corresponding increase in cost, by performing tests on multiple devices under test at the same time. Addition of this capability to a modular, re-configurable, open architecture test system paves the way for an even more cost-effective solution. This paper describes the parallel test strategy adopted in the T2000 tester from Advantest Corporation, which is based on the OPENSTARtrade platform

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