Harmonization of standard procedures for ADC time domain dynamic testing

The paper deals with the ADC dynamic parameters and test methods in the time domain by means of sine wave fitting. An analytical comparison of these methods, according to the internationally available standards and the research in the field, is described. The results of an experimental investigation carried out on actual ADCs by applying the sine wave fitting methods are also reported and compared as a step towards the harmonization of the existing standards.

[1]  Sergio Rapuano,et al.  ADC standard harmonization: Comparison of test methods - Phase II , 2009, 2009 IEEE Instrumentation and Measurement Technology Conference.

[2]  Antonio Moschitta,et al.  Cramér–Rao Lower Bound for Parametric Estimation of Quantized Sinewaves , 2007, IEEE Transactions on Instrumentation and Measurement.

[3]  Gene H. Golub,et al.  The differentiation of pseudo-inverses and non-linear least squares problems whose variables separate , 1972, Milestones in Matrix Computation.

[4]  J. Blair.  Sine-fitting software for IEEE Standards 1057 and 1241 , 1999, IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309).

[5]  Kcstcr.  The Data Conversion Handbook , 2007 .

[6]  Pasquale Daponte,et al.  Dynamic testing and diagnostics of digitizing signal analyzers , 1992, [1992] Conference Record IEEE Instrumentation and Measurement Technology Conference.

[7]  Pasquale Daponte,et al.  Experimental Comparison of Different Standards for Dynamic Characterization of ADCs , 2009, IEEE Transactions on Instrumentation and Measurement.

[8]  Raul Carneiro Martins,et al.  Simulation and experimental results of multiharmonic least-squares fitting algorithms applied to periodic signals , 2006, IEEE Transactions on Instrumentation and Measurement.

[9]  István Kollár,et al.  Four-parameter fitting of sine wave testing result: iteration and convergence , 2004, Comput. Stand. Interfaces.

[10]  I. Kollar,et al.  Standard framework for IEEE-STD-1241 in MATLAB [ADC testing] , 2001, IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188).

[11]  E. Nunzi.  C-code software implementation of standardized ADC test methods , 2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510).

[12]  Kui-Fu Chen,et al.  Four-parameter sine wave fitting by Gram–Schmidt orthogonalization , 2008 .

[13]  J. Schoukens,et al.  A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter , 1996, Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Tec.

[14]  A. Serra,et al.  Uncertainty of the Estimates of Sine Wave Fitting of Digital Data in the Presence of Additive Noise , 2006, 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings.

[15]  J. Schoukens,et al.  The interpolated fast Fourier transform: a comparative study , 1991 .

[16]  P. Handel,et al.  Multiple-tone estimation by IEEE standard 1057 and the expectation-maximization algorithm , 2003, Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412).

[17]  Peter Händel,et al.  Properties of the IEEE-STD-1057 four-parameter sine wave fit algorithm , 2000, IEEE Trans. Instrum. Meas..

[18]  E. Nunzi.  Characterization of ΔΣ Converters by Means of the Sine-fit Algorithm , 2006, 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings.

[19]  John E. Dennis,et al.  Numerical methods for unconstrained optimization and nonlinear equations , 1983, Prentice Hall series in computational mathematics.

[20]  Pasquale Arpaia,et al.  A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing , 2001, IEEE Trans. Instrum. Meas..

[21]  Amerigo Trotta,et al.  Fast and accurate ADC testing via an enhanced sine wave fitting algorithm , 1999 .

[22]  Rik Pintelon,et al.  An improved sine-wave fitting procedure for characterizing data acquisition channels , 1995 .

[23]  Sergio Rapuano.  Preliminary Considerations on ADC Standard Harmonization , 2008, IEEE Transactions on Instrumentation and Measurement.

[24]  A. Cruz Serra,et al.  New methods to improve convergence of sine fitting algorithms , 2003, Comput. Stand. Interfaces.

[25]  A. Moschitta,et al.  Statistical Efficiency of Sinewave Fitting When Using Non-Linear Quantizers , 2005, 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings.

[26]  A. Cruz Serra,et al.  A new four parameter sine fitting technique , 2004 .

[28]  Jose Machado da Silva,et al.  Dynamic characterisation of analogue-to-digital converters , 2005 .

[29]  Peter Händel,et al.  IEEE Standard 1057, Cramér-Rao Bound and the Parsimony Principle , 2003 .

[30]  István Kollár,et al.  ADC Testing With Verification , 2007, IEEE Transactions on Instrumentation and Measurement.

[31]  Peter Händel.  Cramér-Rao Bounds and Non-Linear Least Squares for a Seven Parameter Dual Channel Sinewave Model , 2007, IMTC 2007.

[32]  R.F. Weddleton,et al.  Harmonization of IEEE and IEC electrical insulation standards , 1995, Proceedings:Electrical Electronics Insulation Conference and Electrical Manufacturing & Coil Winding Conference.

[33]  T. Grandke.  Interpolation Algorithms for Discrete Fourier Transforms of Weighted Signals , 1983, IEEE Transactions on Instrumentation and Measurement.

[34]  I. Kollar,et al.  Robust Sine Wave Fitting in ADC Testing , 2006, 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings.

[35]  D. Slepicka,et al.  System for Testing Middle-Resolution Digitizers using Test Signal up to 20 MHz , 2006, 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings.

[36]  P. Daponte,et al.  ADC testing - Part 7 in a series of tutorials in Instrumentation and Measurements , 2006, IEEE Instrumentation & Measurement Magazine.

[37]  Peter Händel,et al.  IEEE Standard 1057, Crame/spl acute/r-Rao bound and the parsimony principle , 2006, IEEE Transactions on Instrumentation and Measurement.