Design for Autonomous Test
暂无分享,去创建一个
[1] D. C. King. Diagnosis and reliable design of digital systems , 1977 .
[2] James B. Angell,et al. Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic , 1973, IEEE Transactions on Computers.
[3] Huiyan Wang,et al. The ttl data book for design engineers , 1981 .
[4] Thomas W. Williams,et al. Testing Logic Networks and Designing for Testability , 1979, Computer.
[5] James E. Smith,et al. Measures of the Effectiveness of Fault Signature Analysis , 1980, IEEE Transactions on Computers.
[6] Jack Edward Stephenson,et al. A testability measure for register-transfer level digital circuits , 1974 .
[7] Edward J. McCluskey. Verification Testing , 1982, 19th Design Automation Conference.
[8] Peter S. Bottorff,et al. Test generation for large logic networks , 1977, DAC '77.
[9] R. L. Wadsack,et al. Fault modeling and logic simulation of CMOS and MOS integrated circuits , 1978, The Bell System Technical Journal.
[10] Jacob Savir,et al. Syndrome-Testable Design of Combinational Circuits , 1980, IEEE Transactions on Computers.
[11] J. Mucha,et al. Built-In Test for Complex Digital Integrated Circuits , 1979, Fifth European Solid State Circuits Conference - ESSCIRC 79.
[12] John E. Bauer,et al. An Advanced Fault Isolation System for Digital Logic , 1975, IEEE Transactions on Computers.
[13] Edward J. McCluskey,et al. Design for autonomous test , 1981 .
[14] Thomas W. Williams,et al. A logic design structure for LSI testability , 1977, DAC '77.
[15] B. Koenemann,et al. Built-in logic block observation techniques , 1979 .
[16] Edward J. McCluskey,et al. Design of Digital Computers , 1975, Texts and Monographs in Computer Science.