A METHOD FOR DETERMINING FOIL THICKNESSES IN TEM BY USING CONVERGENT BEAM ELECTRON DIFFRACTION UNDER WEAK BEAM CONDITIONS
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[1] A. Howie,et al. Electron Microscopy of Thin Crystals , 1977, Nature.
[2] K. Katerbau,et al. A possible source of error in the determination of the type of small lattice defects from electron micrographs , 1977 .
[3] P. Kelly,et al. The determination of foil thickness by scanning transmission electron microscopy , 1975 .
[4] D. Cockayne. A Theoretical Analysis of the Weak-beam Method of Electron Microscopy , 1972 .
[5] M. Whelan,et al. Investigations of dislocation strain fields using weak beams , 1969 .