论文信息 - Trap characterization in ultra-wide bandgap Al0.65Ga0.4N/Al0.4Ga0.6N MOSHFET's with ZrO2 gate dielectric using optical response and cathodoluminescence - 字舞流文

Trap characterization in ultra-wide bandgap Al0.65Ga0.4N/Al0.4Ga0.6N MOSHFET's with ZrO2 gate dielectric using optical response and cathodoluminescence

G. Simin | V. Wheeler | C. Eddy | M. Chandrashekhar | Asif Khan | Md. Didarul Alam | M. Gaevski | M. Jewel | Shahab Mollah | K. Hussain