Acoustic field mapping on GaAs using microscopic reflectance and reflectance anisotropy

The mapping of surface acoustic wave (SAW) fields by means of microscopic reflectance and reflectance anisotropy in GaAs-based structures is reported. The two techniques are complementary with the second being sensitive to the strain and the first both to the strain and to the surface modulation induced by the SAW. Their combination provides information about both the longitudinal and transverse components of the SAW particle displacement vector.

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