High-volume manufacturing equipment and processing for directed self-assembly applications

Directed Self-Assembly (DSA) is one of the most promising technologies for scaling feature sizes to 16 nm and below. Both line/space and hole patterns can be created with various block copolymer morphologies, and these materials allow for molecular-level control of the feature shapes—exactly the characteristics that are required for creating high fidelity lithographic patterns. Over the past five years, the industry has been addressing the technical challenges of maturing this technology by addressing concerns such as pattern defectivity, materials specifications, design layout, and tool requirements. Though the learning curve has been steep, DSA has made significant progress toward implementation in high-volume manufacturing. Tokyo Electron has been focused on the best methods of achieving high-fidelity patterns using DSA processing. Unlike other technologies where optics and photons drive the formation of patterns, DSA relies on surface interactions and polymer thermodynamics to determine the final pattern shapes. These phenomena, in turn, are controlled by the processing that occurs on clean-tracks, etchers, and cleaning systems, and so a host of new technology has been developed to facilitate DSA. In this paper we will discuss the processes and hardware that are emerging as critical enablers for DSA implementation, and we will also demonstrate the kinds of high fidelity patterns typical of mainstream DSA integrations.

[1]  Richard A. Farrell,et al.  Manufacturability considerations for DSA , 2014, Advanced Lithography.

[2]  Makoto Muramatsu,et al.  Simulation analysis of directed self-assembly for hole multiplication in guide pattern , 2014, Advanced Lithography.

[3]  Jian Yin,et al.  The SMARTTM Process for Directed Block Co-Polymer Self-Assembly , 2013 .

[4]  Akiteru Ko,et al.  Fabrication of 28nm pitch Si fins with DSA lithography , 2013, Advanced Lithography.

[5]  Joy Y. Cheng,et al.  Simple and versatile methods to integrate directed self-assembly with optical lithography using a polarity-switched photoresist. , 2010, ACS nano.

[6]  Roel Gronheid,et al.  Comparison of directed self-assembly integrations , 2012, Other Conferences.

[7]  Eungnak Han,et al.  Fabrication of Lithographically Defined Chemically Patterned Polymer Brushes and Mats , 2011 .

[8]  X. Chevalier,et al.  Self-assembly of high-resolutions PS-b-PMMA block-copolymers: processes capabilities and integration on 300mm track , 2014, Advanced Lithography.

[9]  H.-S. Philip Wong,et al.  Block copolymer directed self-assembly enables sublithographic patterning for device fabrication , 2012, Advanced Lithography.

[10]  K. Kawasaki,et al.  Equilibrium morphology of block copolymer melts , 1986 .

[11]  K. K. Berggren,et al.  Templated self-assembly of Si-containing block copolymers for nanoscale device fabrication , 2010, Advanced Lithography.

[12]  Karine Glinel,et al.  Chemically Nanopatterned Surfaces to Control Bacterial Development , 2014 .

[13]  Makoto Muramatsu,et al.  Defect analysis methodology for contact hole grapho epitaxy DSA , 2014, Advanced Lithography.

[14]  Seiji Nagahara,et al.  Advances in directed self assembly integration and manufacturability at 300 mm , 2013, Advanced Lithography.

[15]  Hengpeng Wu,et al.  All track directed self-assembly of block copolymers: process flow and origin of defects , 2012, Advanced Lithography.

[16]  Robert Seidel,et al.  Investigation of cross-linking poly(methyl methacrylate) as a guiding material in block copolymer directed self-assembly , 2014, Advanced Lithography.