Effect of conductive atomic force microscope tip loading force on tip-sample interface electronic characteristics: Unipolar to bipolar resistive switching transition
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[1] Jun Yeong Seok,et al. Surface redox induced bipolar switching of transition metal oxide films examined by scanning probe microscopy , 2011 .
[2] I. Baek,et al. Write Current Reduction in Transition Metal Oxide Based Resistance Change Memory , 2008 .
[3] Cohen,et al. High-pressure electrical conductivity measurements in the copper oxides. , 1989, Physical review. B, Condensed matter.
[4] E. Bellingeri,et al. Modulation of resistance switching in Au/Nb:SrTiO3 Schottky junctions by ambient oxygen , 2012 .
[5] Daniele Ielmini,et al. Switching of nanosized filaments in NiO by conductive atomic force microscopy , 2012 .
[6] C. Frisbie,et al. Conducting Probe Atomic Force Microscopy: A Characterization Tool for Molecular Electronics , 1999 .
[7] R. Waser,et al. Nanoionics-based resistive switching memories. , 2007, Nature materials.
[8] Bharat Bhushan,et al. Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy , 2000 .
[9] Rainer Waser,et al. Nanoscale resistive switching in SrTiO3 thin films , 2007 .
[10] Rainer Waser,et al. The influence of copper top electrodes on the resistive switching effect in TiO2 thin films studied by conductive atomic force microscopy , 2009 .
[11] V. Singh,et al. Electrical and optical properties of Sn doped CuInO2 thin films: Conducting atomic force microscopy and spectroscopic ellipsometry studies , 2009 .
[12] B. Kahng,et al. Multilevel unipolar resistance switching in TiO2 thin films , 2009 .
[13] B. Mehta,et al. Conducting atomic force microscopy studies of InN nanocomposite layers having conducting and nonconducting phases , 2007 .
[14] Nini Pryds,et al. Resistance switching at the interface of LaAlO3/SrTiO3 , 2010 .
[15] J. Brugger,et al. CAFM investigations of filamentary conduction in Cu2O ReRAM devices fabricated using stencil lithography technique , 2012, Nanotechnology.
[16] B. Akhremitchev,et al. Adhesion Forces in Conducting Probe Atomic Force Microscopy , 2003 .
[17] Robert P. H. Chang,et al. Coherent island formation of Cu_2O films grown by chemical vapor deposition on MgO(110) , 2001 .
[18] D. F. Ogletree,et al. Observation of proportionality between friction and contact area at the nanometer scale , 1999 .