Optical second-harmonic imaging of PbxCd1−xTe ternary alloys
暂无分享,去创建一个
Erich G. Rohwer | Ernesto Dieguez | Edgardo Saucedo | L. Fornaro | H. Stafast | H. M. von Bergmann | E. Rohwer | E. Saucedo | E. Dieguez | H. Stafast | T. Scheidt | H. V. Bergmann | L. Fornaro | T. Scheidt
[1] Shen,et al. General considerations on optical second-harmonic generation from surfaces and interfaces. , 1986, Physical review. B, Condensed matter.
[2] Bloch,et al. Electron Photoinjection from Silicon to Ultrathin SiO2 Films via Ambient Oxygen. , 1996, Physical review letters.
[3] P. Rudolph,et al. Distribution and genesis of inclusions in CdTe and (Cd,Zn)Te single crystals grown by the Bridgman method and by the travelling heater method , 1995 .
[4] A. Fedyanin,et al. Oxide-thickness dependence of second harmonic generation from thick thermal oxides on Si(111) , 1995 .
[5] Gerd Marowsky,et al. Optical second-harmonic interferometric spectroscopy of Si ( 111 ) − SiO 2 interface in the vicinity of E 2 critical points , 2002 .
[6] P. Rudolph. Fundamental studies on Bridgman growth of CdTe , 1994 .
[7] Yaochun Shen. Principles of nonlinear optics , 1984 .
[8] M. Downer,et al. Second-harmonic generation from silicon nanocrystals embedded in SiO2 , 2001 .
[9] A. A. Nikulin,et al. Macroscopic size effects in second harmonic generation from Si(111) coated by thin oxide films: The role of optical casimir nonlocality , 1997 .
[10] Shen,et al. Bulk contribution in surface second-harmonic generation. , 1988, Physical review. B, Condensed matter.
[11] Rasing,et al. Vicinal Si(111) surfaces studied by optical second-harmonic generation: Step-induced anisotropy and surface-bulk discrimination. , 1990, Physical review. B, Condensed matter.
[12] Krause,et al. Identification of strained silicon layers at Si-SiO2 interfaces and clean Si surfaces by nonlinear optical spectroscopy. , 1993, Physical review letters.
[13] Z. H. Dughaish. Lead telluride as a thermoelectric material for thermoelectric power generation , 2002 .
[14] Kurz,et al. Electronic transitions at Si(111)/SiO2 and Si(111)/Si3N4 interfaces studied by optical second-harmonic spectroscopy. , 1995, Physical review letters.
[15] H. Girault,et al. Second-harmonic generation in the characterisation of epitaxial CdxHg1−xTe(CMT){1 1 1} surfaces , 1998 .
[16] Nicolaas Bloembergen,et al. Light waves at the boundary of nonlinear media , 1962 .
[17] P. Brevet. Surface Second Harmonic Generation , 1997 .
[18] E. Rohwer,et al. Charge-carrier dynamics and trap generation in native Si/SiO 2 interfaces probed by optical second-harmonic generation , 2004 .
[19] Electric field induced second harmonic generation spectroscopy on a metal‐oxide‐silicon structure , 1996 .
[20] Gunter Lüpke,et al. Characterization of semiconductor interfaces by second-harmonic generation , 1999 .
[21] van Driel HM,et al. SiO2/Si interfacial structure on vicinal Si(100) studied with second-harmonic generation. , 1993, Physical review. B, Condensed matter.
[22] Moss,et al. Empirical tight-binding calculation of dispersion in the second-order nonlinear optical constant for zinc-blende crystals. , 1987, Physical review. B, Condensed matter.
[23] E. Saucedo,et al. Some structural aspects of PbxCd1−xTe bulk material , 2004 .
[24] J. Dadap,et al. Randomly oriented Angstrom‐scale microroughness at the Si(100)/SiO2 interface probed by optical second harmonic generation , 1994 .
[25] Y. Shen,et al. Surface properties probed by second-harmonic and sum-frequency generation , 1989, Nature.
[26] Wayne H. Knox,et al. Si/SiO2 interface roughness: Comparison between surface second harmonic generation and x-ray scattering , 1997 .