Nanohardness and tribological properties of nc-TiB2 coatings

[1]  Maxence Bigerelle,et al.  A comparison of models for predicting the true hardness of thin films , 2012 .

[2]  I. Vávra,et al.  The influence of low-energy ion bombardment on the microstructure development and mechanical properties of TiBx coatings , 2011 .

[3]  V. Buršíková,et al.  Mechanical properties of superhard TiB2 coatings prepared by DC magnetron sputtering , 2007 .

[4]  U. E. Klotz,et al.  Critical evaluation of the Fe-Ni, Fe-Ti and Fe-Ni-Ti alloy systems , 2006 .

[5]  C. Mitterer,et al.  Self-organized nanocolumnar structure in superhard TiB2 thin films , 2005 .

[6]  E. Olsson,et al.  Microstructure of d.c. magnetron sputtered TiB2 coatings , 2004 .

[7]  C. Braham,et al.  Multi-reflection method and grazing incidence geometry used for stress measurement by X-ray diffraction , 2003 .

[8]  C. Mitterer,et al.  Microstructure, mechanical and tribological properties of PACVD Ti(B,N) and TiB2 coatings , 2003 .

[9]  C. Mitterer,et al.  Low-stress superhard Ti-B films prepared by magnetron sputtering , 2003 .

[10]  J. Celis,et al.  Ti–B and Ti–B–C coatings deposited by plasma immersion ion implantation and their fretting behavior , 2003 .

[11]  E. S. Puchi-Cabrera.  A new model for the computation of the composite hardness of coated systems , 2002 .

[12]  M. Larsson,et al.  Low stress TiB2 coatings with improved tribological properties , 2001 .

[13]  A. Baczmaiiski.  PROGRESS IN X-RAY DIFFRACTION OF RESIDUAL MACRO-STRESS DETERMINATION RELATED TO SURFACE LAYER GRADIENTS AND ANISOTROPY , 2001 .

[14]  M. Larsson,et al.  Evaluation of magnetron-sputtered TiB2 intended for tribological applications , 2000 .

[15]  Frans Spaepen,et al.  Interfaces and stresses in thin films , 2000 .

[16]  Alexander M. Korsunsky,et al.  On the hardness of coated systems , 1998 .

[17]  Xun Cai,et al.  Hardness measurements of thin films-determining the critical ratio of depth to thickness using FEM , 1995 .

[18]  S. Hogmark,et al.  Hardness measurements of thin films , 1984 .