论文信息 - Impact of backside interface on Hot Carriers degradation of thin film FDSOI Nmosfets - 字舞流文

Impact of backside interface on Hot Carriers degradation of thin film FDSOI Nmosfets

O. Weber | F. Andrieu | X. Garros | P. Scheiblin | G. Reimbold | L. Brunet | M. Rafik | A. Bravaix | E. Vincent | A. Subirats