Studies of ESD-related failure patterns of Agilent oxide VCSELs
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Joachim J. Krueger | Mark R. Keever | Scott A. McHugo | Ningxia Tan | Myrna S. Mayonte | Mike Heidecker | David Eastley | Reena Sabharwal | Kimanh Nguyen | Naginder Janda | Christopher P. Kocot | C. Kocot | S. McHugo | Kimanh D Nguyen | M. Keever | J. Krueger | Reena Sabharwal | N. Tan | Naginder Janda | Mike Heidecker | David Eastley
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